Empowering the Next Generation through Learning and Development

At the heart of knowledge and growth, the academia and institute market thrives as a cornerstone of education and research. These institutions, ranging from schools to research centers, cultivate learning, curiosity, and expertise. They not only shape individuals' futures but also contribute to society's progress through discoveries and advancements. This dynamic market fosters intellectual exploration, innovation, and the cultivation of leaders who will shape tomorrow's world

Core Solutions
Phenom ParticleX Battery Desktop SEM
Desktop Scanning Electron Microscope | SEM

A desktop version of the electron microscope, equipped with a simplified user interface and design as compared to the electron microscope.

Analytical Probing
Analytical Probing

To position electrical or radio frequency (RF) probes onto a sample to test its response to external stimulus. 

FT200 Series
XRF Coating Thickness Analyzer

Coating Thickness, Elemental Analysis & RoHS Inspection Using X-Ray Fluorescence Analyzer.

CAL3K-AP Oxygen Bomb Calorimeter System
Oxygen Bomb Calorimeter Systems

Heat measurement on ignited samples that is applicable to food processing, feed stock composition, material and waste analysis, quality control, recycling and alternative energy harvesting.

Nanobrook Series
Particle Size Analyzer, Zeta Potential Analyzer & Molecular Weight

Configurable Platform for Particle Sizing and Zeta Potential Measurements based on the principles of Dynamic Light Scattering (DLS).

Renishaw - inVia Reflex
Raman Spectroscopy Equipment

Raman systems are excellent for characterising the properties of materials at sub-micrometre, and potentially nanometre, scales.

X-ray Photoelectron Spectroscope

To analyse a sample's surface elemental composition and chemical bonding state through X-ray photoelectrons. 

Rigaku X-Ray Diffractometers
X-Ray Diffraction

To analyse physical properties such as phase composition, crystal structures and orientation of powder, solid and liquid samples through X-ray diffraction.

Atomic Force Microscopes | AFM
Atomic Force Microscopes | AFM

To obtain high-resolution images to measure and visualise materials at an atomic and nano scale.

PECS II System
Ion Milling for SEM/TEM Samples Preparation

Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques.


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