Continuous-Wave Terahertz Spectroscopy for the VERTEX 80v FTIR
Product Overview
The verTera is revolutionary extension for the VERTEX 80v FTIR spectrometer, enabling seamless integration of continuous-wave (cw) terahertz (THz) spectroscopy into a single instrument. As the first system to offer combined FTIR and cw THz analysis, verTera expands the spectral range down to 3 cm⁻¹ (< 90 GHz), offering unmatched performance for high-resolution THz applications without the need for cryogenic cooling.
Utilizing advanced semiconductor photomixer technology and a unique data processing algorithm, verTera delivers an effective spectral resolution better than 0.0007 cm⁻¹ (< 20 MHz). This makes it ideal for gas-phase spectroscopy, solid-state physics, polymer research, and pharmaceutical analysis, while operating with the same sample compartment and accessories as FTIR.
Key Features
- Extends VERTEX 80v to cover 3 cm⁻¹ to 50,000 cm⁻¹ (THz to UV)
- Effective THz resolution < 0.0007 cm⁻¹ (< 20 MHz)
- No cryogenics needed: room temperature operation
- Integrates cw THz source and detector into VERTEX beam path
- Uses vacuum optics to minimize interference and boost performance
- THz and FTIR data managed together in Bruker’s OPUS software
- Compatible with standard FTIR accessories (gas cells, ATR, reflection)
- Switchable detector system retains full FTIR flexibility
- Compact, laser-safe design (Class 1) with push-button startup
- Available in three configurations (verTera-B, BM, BS)
Specifications
| Feature | Specification |
|---|---|
| Spectral Range (verTera-B) | 3 to 40 cm⁻¹ (90 GHz to 1.2 THz) |
| Spectral Range (verTera-BM) | 13 to 50 cm⁻¹ (0.4 to 1.5 THz) |
| Spectral Range (verTera-BS) | 27 to 60 cm⁻¹ (0.8 to 1.8 THz) |
| Resolution | < 0.0007 cm⁻¹ (< 20 MHz) |
| Laser Safety Class | Class 1 (fiber-coupled NIR) |
| Cooling Requirements | None (room temperature operation) |
| Data Processing | OPUS with THz + FTIR merge, macros, quantification |
| Sample Compartment | Same as FTIR; compatible with all standard accessories |
| Detector Switching | Software-controlled; retains standard FTIR detectors |
| Automation | Beam splitter exchange, source switching, emission port access |
Applications
Semiconductor & Solid-State Physics
- Crystal structure analysis and defect mapping
- Measure carrier dynamics and low-energy phonon modes
- Non-destructive evaluation of silicon wafers
Forensics & Quality Control
- Identify material authenticity based on THz spectra
- Analyze coatings, adhesives, and contaminants
- Cross-reference FTIR and THz data for higher confidence
Resources
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