National Electron Microscopy Annual Conference (26 - 30 Sep 2025)

2025 National Electron Microscopy Annual Conference is about aberration-corrected transmission electron microscopy and its applications; in-situ microscopy techniques (covering mechanics, physics, chemistry, biology, etc.) and their applications; high-resolution scanning electron microscopy; microbeam analysis; scanning probe microscopy (including STM, AFM, etc.); cryo-electron microscopy; and laser confocal microscopy.

The conference will also cover the application of these techniques in frontier disciplines such as physical sciences, chemistry, geoscience, life sciences, medicine, and information science, as well as in areas including new energy technologies, thermoelectric materials, information technology, environmental science and technology, and advanced structural materials.

In addition, the conference will showcase the latest progress in microscopy-related theories, instrument development, technologies, and experimental methods. It will also promote exchanges on the operation, management, maintenance, open sharing, and development of electron microscopy and other microscopy facilities, as well as the construction of experimental platforms.